The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 1995
Filed:
Nov. 21, 1990
Charles R Bond, Milpitas, CA (US);
Other;
Abstract
A test disk is used to measure disk drive alignment and other parameters without removing the drive from its computer system and without any need for special test equipment. It includes a pair of prerecorded signal tracks separated by a gap smaller than the width of the head so that one track is used for providing computer readable signals and the other is used to inject variable interference into the composite signal under the head. Multiple pairs of tracks at differing radii are included for measuring drive alignment and other parameters. The method for measuring alignment and other parameters suppresses measurement errors due to disk signal modulation and changes in track radius. Alignment testing requires only a single measurement and is capable of resolving the measurement to the nearest bit so that maximum accuracy is achieved.