The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 1995
Filed:
Apr. 13, 1993
Applicant:
Inventor:
Jefferson H Harman, Thousand Oaks, CA (US);
Assignee:
Wangtek, Inc., Simi Valley, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ;
U.S. Cl.
CPC ...
360 45 ; 360 67 ;
Abstract
A closed loop resolution enhancement technique for reducing density effects to permit increased digital data storage density on magnetic media and improve data reliability for at a given density, uses a predetermined test pattern written on the medium to determine the ratio of amplitudes of high and low frequency components of the test pattern and adjust a resolution value. After a test pattern read operation is used to adjust the resolution value, the same value is used during normal data recovery operations.