The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 1995

Filed:

Mar. 16, 1993
Applicant:
Inventors:

Kenya Uomori, Kyoto, JP;

Mitsuho Yamada, Kyoto, JP;

Hitoshi Hongo, Kyoto, JP;

Hiroshi Yoshimatsu, Kyoto, JP;

Keiichi Ueno, Kyoto, JP;

Shinji Murakami, Hokkaido, JP;

Mitsuru Fujii, Hokkaido, JP;

Norihito Nakano, Hokkaido, JP;

Jiro Miyazawa, Hokkaido, JP;

Ryo Fukatsu, Hokkaido, JP;

Naohiko Takahata, Hokkaido, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351209 ; 351210 ; 351211 ; 351221 ;
Abstract

In an apparatus for examining gaze shift in depth direction, light emitting diodes B and E, or D and C are lit at a plurality of positions with different distance in depth direction from the subject, and eye movement of the subject at that time is detected by an eye movement detecting portion. The signal of detection is processed in a signal processing circuit and is applied to a calculating portion. The calculating portion determines whether or not there is a disorder in gaze shift in depth direction of the subject by using any or all of latency in eye movement, time constant, amplitude, change in convergence angle, number of occurrence of saccade, and asymmetry of left and right eye movements, in response to the detected output of the eye movement.


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