The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1995

Filed:

Jan. 11, 1993
Applicant:
Inventors:

Steve Ernst, Colorado Springs, CO (US);

Gordon A Jensen, Colorado Springs, CO (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
364514 ; 324533 ;
Abstract

A token ring local area network (LAN) testing apparatus is provided. The apparatus utilizes time delay reflectory (TDR) in testing cable conductors that link or interconnect stations on the token ring with the token ring media access unit (MAU). In making the TDR related measurements, a directional coupler device is used in transmitting and receiving signals relative to the cable conductor. Information related to the magnitude and location of any cable conductor fault that is obtained. A TDR measurement can be used to determine the existence of a fault at the end of a cable conductor. A single matching impedance element is selected to match the impedance of the cable conductor before conducting any TDR measurement.


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