The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 1995

Filed:

Sep. 28, 1993
Applicant:
Inventors:

Yutaka Ueda, Nara, JP;

Keizo Ohori, Kyoto, JP;

Tsuneo Shimizu, Anjo, JP;

Shoji Mizutani, Toyohashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364470 ; 57264 ; 364132 ; 364552 ;
Abstract

A quality control system in a material processing mill. The mill may include several different processing machines for performing several different processing steps to produce several different intermediate products. Each processing machine is provided with a sub-processor for monitoring production information associated with the processing machine and quality information associated with the intermediate product produced by the processing machine. The quality and production information from the various sub-processors are directed to a main processor, which records a history of the processing of the various intermediate products.


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