The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 1995
Filed:
Feb. 12, 1993
Applicant:
Inventor:
John P Phipps, Phoenix, AZ (US);
Assignee:
Motorola, Inc., Schaumburg, IL (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324769 ; 437-8 ;
Abstract
Testing of a semiconductor device (10, 30) is facilitated by forming the semiconductor device (10, 30) to have a first portion (17) that is electrically isolated from a second portion (19, 27). Testing is first performed on the first portion (17) of the semiconductor device (10, 30). After the testing is complete, the first portion (17) of the semiconductor device (10, 30) is electrically coupled to the second portion (19, 27) of the semiconductor device (10, 30) .
Phipps, John. (1995). Method of testing a semiconductor device having a first circuit (U.S. Patent No. 5381105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5381105
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile