The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 1995

Filed:

Jan. 07, 1994
Applicant:
Inventor:

Gerald T Wade, Auburn, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395500 ; 3642647 ; 3642609 ; 364280 ; 364264 ; 364D / ;
Abstract

A performance and measurement system can be used to evaluate a computing system. An operating system of the computing system produces performance data about individual processes running on the computing system. The performance data is collected and reduced by combining selected data from the performance data into standardized metrics to produce collected and reduced performance data. The collected and reduced performance data pertains to groups of the individual processes. The collected and reduced performance data is logged into at least one data file. The performance data is discarded.


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Wade, Gerald. (1995). Performance and measurement system which logs reduced data pertaining to (U.S. Patent No. 5379406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5379406

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