The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1995
Filed:
Jun. 19, 1991
Marc E Levitt, Sunnyvale, CA (US);
Sun Microsystems, Inc., Mountain View, CA (US);
Abstract
Two related methods and apparatus for determining a binary constant to be output from embedded memory arrays into system logic of an integrated circuit when the system logic is being tested, that maximizes improvement to fault coverage of the system logic, are disclosed. The present invention has particular application to digital system testing. The fault coverage of the system logic is improved due to its controllability and observability are indirectly enhanced by the enhanced controllability of the embedded memory arrays. The first related method and apparatus determines the binary constant based on a testability measure selected for the system logic. The second related method and apparatus determines the binary constant based on results from automated test patterns generation for the integrated circuit. Both methods and apparatus provide a constant that is more effective than a randomly assigned binary constant, but without the expensive computations required for a binary constant determined from all possible enumeration.