The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1995
Filed:
Jul. 30, 1992
Applicant:
Inventor:
Edward W Stark, New York, NY (US);
Assignee:
Other;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G06G / ; G06F / ;
U.S. Cl.
CPC ...
364578 ; 128633 ; 324322 ; 356 39 ; 36441307 ; 364498 ; 364574 ;
Abstract
A method and apparatus for the determination of spectral samples is disclosed wherein spectral measurements are taken, normalization of the spectral measurements takes place, and a bilinear modeling is performed to extract spectral data. Once this data is derived, the interference quantitization levels are determined using multiple linear regression analysis, and are then removed from the sample readings in order to determine a more precise level of analyte spectra, such as analyte levels of glucose in serum or whole blood.
Published as:
EP0385805A2; EP0385805A3; US5379238A; EP0385805B1; DE69027233D1; DK0385805T3; DE69027233T2; USRE36474E;