The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1995
Filed:
Mar. 24, 1993
Jean-Francais Ollivier, Merdrignac, FR;
Said Lalaouna, La Ferte Bernard, FR;
Manuel Penha, Le Mans, FR;
Framatome Connectors International, Paris La Defense, FR;
Abstract
This invention relates to a process for measurement of the relative positions of the center-lines of an aperture and of a cylindrical outline of a sample. The process includes the following steps: introducing a calibrated rod into said aperture; performing measurements to define at least a pair of segments representative of the mid-points of the cylindrical outline and of a calibrated rod respectively. The measurements are performed utilizing a light beam which is scanned parallel to the beam in a direction perpendicular to the center-line of the cylindrical outline. This enables measurement of the coaxiality and/or of the concentricity of the center-line of the outline and of the aperture.