The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1995
Filed:
Oct. 23, 1992
Toshiaki Matsui, Tokyo, JP;
Kenichi Araki, Higashi-Murayama, JP;
Abstract
The surface characteristics with respect to a high-frequency electromagnetic field of a material to be tested are measured by placing opposite a flat mirror material to be tested one of a pair of concave spherical reflection mirrors fabricated in the same way and formed with high-reflectance circular coupling regions, placing the other spherical reflection mirror at a position symmetrical to the one reflection mirror with respect to the flat mirror material as the plane of symmetry, measuring the Q value of the open resonator formed by the one reflection mirror and the flat mirror material, removing the flat mirror material from the optical axis, measuring the Q value of the open resonator formed by the pair of spherical reflection mirrors, calculating the absolute value of the reflectance of the flat mirror material to be tested from the difference between the two measured Q values, and calculating the phase of the reflected wave at the surface of the flat mirror material to be tested from the measured resonance position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile