The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1995
Filed:
Oct. 22, 1992
Makoto Iki, Tokyo, JP;
Hirofumi Matsuo, Tokyo, JP;
Masahiro Oono, Tokyo, JP;
Masato Noguchi, Tokyo, JP;
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
An interferometer causes a reference beam and a subject beam reflected from a roof surface to interfere with each other to form an interference fringe, which is detected by an image detecting element in its measuring area. Detection data from the image detecting element is processed by an image processing circuit, and then subjected to phase difference detection. A continuous function is determined as an approximation to a relationship between phase data and unit measuring areas located in a direction perpendicular to a line corresponding to a ridge line of the roof surface. A analysis relating to a roof angle is performed based on the continuous function thus determined.