The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1995
Filed:
Aug. 28, 1992
Yasutsugu Seo, Tokyo, JP;
Masafumi Kondo, Ootawara, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
Where an imaging volume of an object under examination is comprised of eight slices with four regions 'a', 'b', 'c', and 'd' per slice (on the k space), the RF pulse frequency, the slice-selection gradient magnetic field, and the phase-encoding gradient magnetic field are controlled so as to first acquire data for a region 'a' of each of the slices #1 to #8 in sequence and then acquire data for the slices #1 to #8 for each of the regions 'b' to 'd' in sequence. The data with 4 rows and 8 columns thus obtained for each of the regions of the slices is rearranged into data with 8 rows and 4 columns arranged for each of the slices. Data in each row are subjected to two-dimensional Fourier transformation, so that an MR image corresponding to each slice is reconstructed. This permits the RF pulse repetition time TR to be made long even if a time interval between successive data acquisition is made short. Thus, a multi-slice divisional-scanning type magnetic resonance imaging apparatus can be realized, which permits T2 contrast images with high signal-to-noise ratio to be obtained in a short time.