The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 1994

Filed:

Jul. 01, 1991
Applicant:
Inventors:

Steven F Wayne, Scituate, MA (US);

David A O'Neil, Waltham, MA (US);

Charles E Zimmerman, Clarkston, MI (US);

Yefim Val, Troy, MI (US);

Assignee:

Valenite Inc., Madison Heights, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36447417 ; 36447424 ; 36447416 ; 395904 ;
Abstract

A method of designing a cutting tool uses finite element numerical models to predict a response of the tool during a simulated cutting operation on a workpiece, and to simulate a chip-flow phenomenon occurring during the cutting operation. The chip-flow model incorporates representations of a fracture mechanism describing a chip separation phenomenon, a heat-generating mechanism describing a thermal coupling phenomenon, and a shear localization mechanism describing a shearing phenomenon wherein these phenomena occur during the cutting operation. The predicted tool response and the chip-flow simulation are evaluated by an artificial intelligence system to render rule-based judgments which are embodied in recommendations for continuously modifying the models and input design variables until the simulation and response converge to an optimal result.


Find Patent Forward Citations

Wayne, Steven. (1994). Method and system for designing a cutting tool (U.S. Patent No. 5377116). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5377116

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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