The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 1994

Filed:

Dec. 23, 1992
Applicant:
Inventors:

Patrick Brown, Stanford, CA (US);

Stanley Nelson, Menlo Park, CA (US);

Sue Klapholz, Stanford, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ; C12P / ;
U.S. Cl.
CPC ...
435-6 ; 435 911 ; 935 77 ; 935 78 ;
Abstract

Genetic mapping is provided by combinations of two related general procedures. In the first procedure, mapping is provided by identifying genetic regions from which DNA fragments derived from two individuals can combine to form extensive hybrids free of base mismatches. DNA is processed by a method that allows perfectly-matched hybrid DNA molecules formed between DNAs from the two individuals, to be separated from imperfectly-paired DNA hybrids or hybrids in which both strands are from the same individual's DNA. The perfectly-matched hybrid DNAs can then be labeled and the labeled DNA used as probes to identify loci of identity-by-descent between the two individuals. In the second procedure, nicks are introduced specifically into DNA hybrids formed between non-identical alleles from a region of heterozygosity in an individual diploid genome. The nicked DNA molecules are then specifically labeled to provide probes for identifying regions of heterozygosity in the genome of an individual.


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