The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 1994

Filed:

Jun. 17, 1994
Applicant:
Inventors:

David A College, Harrisburg, PA (US);

David J Erb, Harrisburg, PA (US);

Assignee:

The Whitaker Corporation, Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33804 ; 33805 ; 33783 ; 33545 ; 33555 ;
Abstract

An apparatus for measuring crimp height between crimped opposite sides of a terminal which has been crimped to an element is provided. The apparatus is particularly useful for measuring the crimp height of a terminal when one or more of the crimped opposite sides has a surface profile that is non-planar, or when a soft insulation sleeve is present on the terminal in the crimp area. The apparatus includes a pair of opposed probe members which are relatively movable between open and closed positions. In the open position the probe members are spaced apart- In the closed position the probe members are biased against the crimped opposite sides by springs. The probe members are specially configured to match the surface profiles of the crimped opposite sides.


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