The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 1994
Filed:
Feb. 04, 1991
John M Moreland, Louisville, CO (US);
Paul Rice, Boulder, CO (US);
The United States of America as represented by the Secretary of Commerce, Washington, DC (US);
Abstract
This invention relates principally to methods and apparatus for recording data on and reading data from a magnetizable medium using a scanning tunneling technique. Conventional rigid probes used in scanning tunneling microscopy (STM) and the like are replaced by a compliant magnetic probe wherein the STM image is a convolution of magnetic forces and the surface topography of the magnetizable medium. Data can be written to the medium by increasing the tunneling current, reducing the scan rate, and/or increasing the magnetization of the compliant magnetic tunneling tip in order to alter the local magnetic characteristics of the medium. A preferred material for the compliant probe is a free-standing thin film of iron vacuum-deposited on a glass substrate and later removed therefrom. The compliant probe of the invention may also be employed for imaging the local surface magnetization of a magnetic member.