The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 1994

Filed:

Jun. 24, 1993
Applicant:
Inventors:

Klaus Volkmann, Bergisch-Gladbach, DE;

Horst Pollok, Wesseling, DE;

Manfred Kickartz, Bruhl, DE;

Assignee:

Krautkramer GmbH & Co., Hurth-Efferen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73602 ; 73620 ; 73629 ; 330 60 ; 330252 ;
Abstract

An ultrasonic measuring device that is especially suited to nondestructive testing of materials is fitted with an ultrasound test head 72, a transmitter (74) and a receiver (76) that is characterized by a broadband logarithmic amplifier (78). This amplifier consists of several amplifier stages that are identical in construction and connected in series. Each amplification stage is characterized by the fact that it contains two transistorized individual amplifiers, namely a first and a second differential amplifier that are connected to one another and whose transistors (20, 22; 24, 26) are each interconnected at their base and at their collector. Each of these transmitters is connected at the emitters via inverse feedback resistors (34, 36; 40, 42) to a constant-current source (46, 50). At least the constant-current source 46 of one of the two differential amplifiers of an amplification stage is connected on one side to a digital analog transformer (58) that provides corrections for calibrating each connected constant-current source (46).


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