The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1994
Filed:
Nov. 02, 1992
David J Ferkinhoff, New Bedford, MA (US);
Kai F Gong, Pawtucket, RI (US);
Kathleen D Keay, Fairhaven, MA (US);
Steven C Nardone, Narragansett, RI (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A system for providing an iterative method of assessing accuracy of selec models of physical phenomena and for determining selection of alternate models in response to a data sequence in the presence of noise. Initially, a residual sequence is generated reflecting difference values between in response to said data sequence and an expected data sequence as would be represented by a selected model. Feature estimate values of a plurality of predetermined data features in the residual sequence are then generated. In response to the feature estimate values, a threshold value is generated for each feature at an estimated ratio of data to noise. Probability values are generated in response to the threshold value, representing the likelihood that the feature exists in the data sequence, does not exist in the data sequence, and that the existence or non-existence in the data sequence is not determinable. Finally, a model is selected in response to the probability values for use during a subsequent iteration.