The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 1994

Filed:

Oct. 04, 1993
Applicant:
Inventors:

Robert A Eckel, Jr, Andover, MA (US);

Gordon C MacKenzie, Billerica, MA (US);

Joseph C Ottney, Lowell, MA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250208 ; 250216 ; 250332 ; 359726 ;
Abstract

An imaging optical system is described including an array of photodetectors, each photodetector having a surface, and a focusing system for focusing a beam of electromagnetic infrared energy on the surface of at least one of the photodetectors. The focusing system further includes a technique for periodically defocusing the beam of electromagnetic infrared energy on the surface of at least one of the photodetectors. With such an arrangement, a scanning and focusing system is provided wherein fixed pattern noise can be decreased.


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