The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 1994
Filed:
Nov. 27, 1992
Takashi Nagano, Tokyo, JP;
Keiji Shimizu, Tokyo, JP;
Kazuo Kajitani, Tokyo, JP;
Masaaki Iwase, Tokyo, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A reflected fluorescence microscope is used to observe a fluorescent image of a stained specimen by reflected illumination, and includes a light source, an excitation filter for converting light from the light source into a plurality of narrow-band excitation lights, a dichroic mirror for reflecting the narrow-band excitation lights emerging from the excitation filter toward the specimen and transmitting therethrough the light emerging from the specimen, an absorption filter for absorbing an extra wavelength component from light emerging from the dichroic mirror and transmitting therethrough a wavelength component of the fluorescent image, an optical system for forming the fluorescent image of the specimen from the wavelength component transmitted through the absorption filter, and a transmission wavelength shifting filter for adjusting the ratio of the quantities of light in units of fluorochromes.