The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 1994
Filed:
Mar. 13, 1992
Hitachi, Ltd., Tokyo, JP;
Abstract
In an inspection apparatus using nuclear magnetic resonance (NMR), a spatial distribution of homogeneity of a static magnetic field can be quickly measured even when a heterogeneous object is inspected, by measuring simultaneously phase data and a transverse relaxation time at the same spatial position of the heterogeneous object, removing the difference of a phase term due to a chemical shift by anticipating components at that position and obtaining only the phase data resulting from static magnetic field inhomogeneity. A plurality of low-pass filters are provided to a shim power supply unit for driving a shim coil for generating additional static magnetic fields to correct static magnetic field homogeneity so that a low-pass filter having a small time constant is used at the time of adjustment of static magnetic field homogeneity so as quickly adjust static magnetic field homogeneity, and a low-pass filter having a large time constant is used at the time of the actual measurement of the object in order to prevent degradation of S/N of signals.