The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 1994

Filed:

Jul. 23, 1992
Applicant:
Inventors:

Robert R Alfano, Bronx, NY (US);

Ping-Pei Ho, Great Neck, NY (US);

Leming Wang, Flushing, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2503411 ; 2503581 ; 128664 ;
Abstract

A system for imaging an object in or behind a highly scattering medium includes a laser for illuminating the highly scattering medium with a beam of light. The light emerging from the highly scattering medium consists of a ballistic component, a snake-like component and a diffuse component. A 4F Fourier imaging system with a Kerr gate located at 2F is used to form a time-space gated image of the emerging light, the time-space gated image consisting primarily of the ballistic component and the snake-like component.


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