The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 1994

Filed:

Dec. 08, 1992
Applicant:
Inventor:

Tadashi Morokuma, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356358 ; 356363 ;
Abstract

A high precision coordinate measuring device comprising a reflecting mirror fixed to a base, a movable holder displaceable in a direction perpendicular to the reflecting mirror, a position detector mounted on the movable holder and an interferometer for detecting a displacement of the position detector relative to the reflecting mirror. The interferometer has a measuring optical system and a reference optical system. This coordinate measuring device uses movable members light in weights thereof and permits performing measurements of lengths with high precision free from Abbe's error.


Find Patent Forward Citations

Morokuma, Tadashi. (1994). High precision location measuring device wherein a position detector and (U.S. Patent No. 5369488). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5369488

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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