The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 1994

Filed:

Jan. 24, 1992
Applicant:
Inventors:

Edward S Di Milia, Gardena, CA (US);

Darrell A Gleichauf, Redondo Beach, CA (US);

Thomas E Whiting, Hermosa Beach, CA (US);

Assignee:

Hughes Aircraft Company, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436148 ; 73 2403 ; 73 2406 ; 7386322 ; 7386324 ; 422 73 ; 422 83 ;
Abstract

A system for monitoring changes in the amount of contaminants present in a flowing stream of supercritical fluid. A sample stream is removed from a flowing stream of supercritical fluid and subjected to reduced pressure. The supercritical fluid turns into gas at the reduced pressure with the contaminants remaining in a non-gaseous form. A quartz crystal microbalance system measures changes in the amount of non-gaseous contaminants present in the sample stream. The system is useful in monitoring both cleaning processes and extraction processes utilizing supercritical fluids.


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