The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 1994

Filed:

May. 06, 1992
Applicant:
Inventors:

Motoyasu Terao, Hinode, JP;

Keikichi Andoo, Musashino, JP;

Shigenori Okamine, Kodaira, JP;

Yasushi Miyauchi, Akishima, JP;

Masahiko Takahashi, Kodaira, JP;

Masaaki Futamoto, Kanagawa, JP;

Reiji Tamura, Ibaraki, JP;

Assignees:

Hitachi, Ltd., Tokyo, JP;

Hitachi Maxell, Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B / ;
U.S. Cl.
CPC ...
430270 ; 430495 ; 430945 ; 3692754 ; 3692751 ; 369284 ;
Abstract

By using an information recording medium comprising at least a substrate and an information recording film which is mounted on the above substrate and changes the physical property under irradiation of a recording energy beam, wherein the surface of the information recording area of the above substrate is uneven, both surfaces of the above recording film are also uneven, and an inorganic protective layer is provided in contact with the surface of the above recording film opposite to the above substrate, fine recording points can be formed stably without complicated control of the recording power and recording waveform so that an optical disk unit can record data simply in high density.


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