The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1994
Filed:
Feb. 07, 1992
Edward T Siebert, New Fairfield, CT (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
A method, and apparatus for accomplishing the method, for determining a phase difference of a wavefront at a first (pupil) plane (P1), the wavefront propagating from the first plane to a second (image) plane (P2). The method includes the steps of providing an intensity of the wavefront at the first plane; measuring an intensity of the wavefront at the second plane; and determining the phase difference of the wavefront at the first plane in accordance with a transfer function that employs the provided intensity of the wavefront at the first plane and the measured intensity of the wavefront at the second plane. A single expression describing an Optical Transfer Function is developed and is shown to involve only the unknown aperture phase and known quantities. A solution to this expression, achieved by a polynomial expansion technique or by a sampling technique, is shown to yield the phase at the aperture and, together with the intensity at the aperture, to define the aperture wavefront.