The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1994
Filed:
Jul. 19, 1993
Fritz Berthold, Pforzheim, DE;
Manfred Pfleger, Wildbad, DE;
Laboratorium Prof. Dr. Rudolph Berthold GmbH & Co. KG, Bad Wildbad, DE;
Abstract
A method for discrimination and simultaneous or separate measurement of single or multiple electronic events in an opto-electronic detector, such as a photo-multiplier, wherein information for the discrimination of these events is obtained from the signal progression occurring at the detector output within a predeterminable time window. According to this method, a characteristic parameter (T.sub.M ; t.sub.b -t.sub.a) is obtained for the temporal 'center of gravity' of the progression of the signal itself or its integral over the time window (T.sub.F), the value of which is compared with a reference value (T.sub.S ; C.sub.1) which this parameter assumes during a single photo-electron event.