The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 1994

Filed:

Jan. 25, 1993
Applicant:
Inventors:

Naohiro Mikawa, Saitama, JP;

Satoshi Ueki, Saitama, JP;

Naomi Koyama, Saitama, JP;

Hiroyuki Furuhashi, Saitama, JP;

Tetsuya Morioka, Saitama, JP;

Shigeyuki Toki, Saitama, JP;

Assignee:

Tonen Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08G / ;
U.S. Cl.
CPC ...
525343 ; 525353 ; 5253591 ; 525386 ; 528272 ; 528279 ; 528293 ;
Abstract

An ethylene polymer which Is capable of being degraded by microorganisms is provided which comprises a recurring unit represented by the general formula ##STR1## in which R is a divalent hydrocarbon group containing 2 to 20 carbon atoms, R' is a divalent hydrocarbon group containing 1 to 20 carbon atoms and A is a polyethylene segment comprising a recurring unit represented by the formula --CH.sub.2.CH.sub.2 -- and having a number average molecular weight (Mn) of 300 to 300,000, and the ethylene polymer having a number average molecular weight (Mn) of 500 to 5,000,000.


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