The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1994
Filed:
Jul. 30, 1991
Keith S Margrey, Charlottesville, VA (US);
Robin A Felder, Charlottesville, VA (US);
James C Boyd, Charlottesville, VA (US);
J William Holman, Earlysville, VA (US);
Jonathan H Roberts, Charlottesville, VA (US);
John Savory, Keswick, VA (US);
Antonia Martinez, Charlottesville, VA (US);
University of Virginia Alumni Patents Foundation, Charlottesvile, VA (US);
Abstract
The present invention relates to an integrated analytical system which includes a plurality of remote laboratories and a central monitoring station. The remote laboratories include a specimen analysis member and a plurality of peripheral devices. The central monitoring station includes a computer for controlling predetermined functions of the peripheral devices. A local area network provides communication between each of the remote laboratories and the central monitoring station. A computer interface provides bi-directional communication between analytical instruments, robots and peripheral devices and a computer. The system employs a robot which is responsive to computer commands and capable of performing mechanical functions. The mechanical functions include manipulating an analytical instrument, transporting the specimens to be analyzed through a variety of locations, and the manipulation of the container in which the specimen is housed.