The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 1994

Filed:

Jun. 10, 1992
Applicant:
Inventor:

David F Crook, Garland, TX (US);

Assignee:

Amei Technologies Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; B29C / ; B22C / ;
U.S. Cl.
CPC ...
164 45 ; 164 35 ; 164-41 ; 36441313 ; 36441315 ; 36447405 ; 36447424 ; 1286531 ; 1286532 ; 264 22 ;
Abstract

A method and apparatus is described for making a custom fixation device. The apparatus comprises a means for scanning a treatment site and for producing image data representative of the treatment site. A means for generating a set of vectors is included for defining a set of points, the set of vectors representative of the treatment site, the points associated with a surface, part of the surface representative of part of the treatment site, part of the surface hidden from view. Further, means for associating each point with a pole of a control polygon of a non-uniform rational B-spline, means responsive to the non-uniform rational B-spline for constructing a model of the treatment site, and means responsive to the model for constructing the fixation device are described.


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