The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 1994
Filed:
Feb. 25, 1993
Akimichi Kira, Miyanohigashi, JP;
Haruto Sugishita, Miyanohigashi, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A fluorescent X-ray quantitative analysis apparatus generates a stream of primary X-rays that are subject to variable conditions such as voltage, X-ray filters, and gas conduit conditions. A sample is supported to receive the beam of primary X-rays, and then measurements are made of the secondary X-rays resulting from impact with the sample. Conditions are changed to affect the primary X-rays, and a second measurement is made of the secondary X-rays from the sample. A computer circuit can determine the concentration of elements in the sample from their respective measurements, for example, by resolving a plurality of simultaneous equations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile