The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1994

Filed:

Oct. 19, 1992
Applicant:
Inventor:

Walter Madigosky, Silver Spring, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364506 ; 364505 ; 364507 ; 73573 ; 73574 ; 73575 ; 73 81 ; 128695 ; 128739 ;
Abstract

Material is periodically indented by a probe driven at an oscillation frency by a shaker regulated by an analyzer to which input measurement data is fed from a sensing head connecting the shaker to the probe for in situ measurement of material resistance to indentation to which such input data relates. A computer connected to the analyzer is programmed to calculate steady-state data on dynamic material properties as a time dependent function, from outputs of the analyzer restricted to limits determined from the input measurement data.


Find Patent Forward Citations

Madigosky, Walter. (1994). In situ dynamic material property measurement system (U.S. Patent No. 5365457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5365457

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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