The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1994

Filed:

Jul. 21, 1993
Applicant:
Inventors:

Garrett J Heyns, Boulder, CO (US);

Terry R McClure, Kersey, CO (US);

Hugh Nicholl, Berthoud, CO (US);

Peter H Read, Morrisville, PA (US);

Steven M Schulte, Westminster, CO (US);

Mohammad F Tabrizi, Westminster, CO (US);

Assignee:

AT&T Bell Laboratories, Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B08B / ; B24C / ; B24C / ; B24C / ;
U.S. Cl.
CPC ...
134-7 ; 134-6 ; 134 18 ; 451 78 ; 451 53 ; 451 39 ;
Abstract

A system for cleaning test probes attached to a probe mat fixture by propelling CO.sub.2 pellets at the test probes, by rotating the fixture so that the pellets impact different sides of the test probes, and by providing electrostatic protection for active devices mounted on the probemat fixture. The CO.sub.2 pellets are propelled so that they strike the test probes at an angle to the horizontal plane of the test probe as mounted on the probemat fixture. Electrostatic protection is provided by connecting all electrical connections to the probemat fixture to ground and by reducing electrostatic charge build up on the probemat fixture by using an ionizer to direct ions at the probemat fixture.


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