The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 1994

Filed:

Sep. 03, 1993
Applicant:
Inventors:

Humio Inaba, Sendai, JP;

Shunichi Sato, Sendai, JP;

Susumu Kikuchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356337 ; 250251 ;
Abstract

A microscopic specimen such as a cell organelle or a tissue cell generally has a non-rotational symmetrical refractive index distribution. Converging onto the microscopic specimen a laser beam with a non-rotational symmetrical intensity distribution (an elliptical pattern) traps the specimen, with the direction of the major axis of the specimen aligned with the direction of the major axis of the elliptical pattern of the laser beam. This is because the laser beam with the non-rotational symmetrical refractive index distribution has a non-rotational symmetrical trapping force, and hence can trap the specimen with non-rotational symmetrical refractive index distribution in a dynamically reliable manner. Thus, rotation of the major axis of the intensity distribution of the laser beam causes rotation of the trapped specimen.


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