The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 1994

Filed:

Aug. 03, 1993
Applicant:
Inventor:

Charles R Welch, Vicksburg, MS (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73862632 ; 73768 ; 73774 ;
Abstract

The present invention provides a free field stress gauge that can operate in a medium with ambient normal stress fields up to 10 kilobars. The invention uses two machined parts, a top annulus cover disc portion and an active bottom disc portion such that the annulus top cover disc covers the active bottom disc portion but allows a solid central sensing column to be exposed to ambient conditions. The disc portions have a dual sealing means to protect the strain gauges therein from fluid ingress. The gauge is suitable for measuring stresses of soil and rock formations as well as concrete, asphalt or other materials in either a static or dynamic regime. The stress gauge is designed for high uni-axial stress measurements, improved frequency response, have low hysteretic induced effects in measurements and be a thinner gauge.


Find Patent Forward Citations

Welch, Charles. (1994). Column-based stress gauge (U.S. Patent No. 5361642). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5361642

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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