The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 1994

Filed:

Sep. 20, 1993
Applicant:
Inventors:

Thomas W Dey, Springwater, NY (US);

Jennifer A LeBaron, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 359727 ; 356359 ;
Abstract

A novel method for assessing a surface figure of an optical element. The method preferably comprises subjecting the optical element to a classical autocollimation testing procedure for ascertaining its surface figure relative to a predetermined ideal. The testing procedure is characterized by a step of modifying the classical optical testing procedure, so that the optical element under test simulates a paraboloid.


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