The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 1994
Filed:
Sep. 01, 1993
Applicant:
Inventor:
Seymour Lowell, Glenhead, NY (US);
Assignee:
Quantachrome Corp., Boynton Beach, FL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436-5 ; 436-8 ; 73 38 ; 738655 ; 73 / ; 73-3 ;
Abstract
A sorption analyzer for performing surface measurement analysis on sample material. The sorption analyzer calibrates the instrument and the sample cell using the adsorbate gas.
Lowell, Seymour. (1994). Method for measuring a sample sorption and a sample cell void volume and (U.S. Patent No. 5360743). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5360743
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile