The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 1994

Filed:

Nov. 12, 1992
Applicant:
Inventors:

Jeffrey P Baker, Poway, CA (US);

Steven C Mott, San Diego, CA (US);

Craig A Wright, San Diego, CA (US);

Assignee:

Horiba Instruments, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
738655 ; 356335 ; 356438 ;
Abstract

A dry particle analyzer includes a vibrating sieve cup drizzling particles downwardly with first and second sheath air flows provided to separate the particles from boundary walls and to form the drizzling particles into a curtain for optical analysis. The particles drop vertically as a drizzle with gravitational assistance from a bulk sample to the analysis passage, after which their direction of movement is changed to horizontal and then upward for removal from the analyzer.


Find Patent Forward Citations

Baker, Jeffrey. (1994). Method and apparatus for dry particle analysis (U.S. Patent No. 5359907). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5359907

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…