The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 1994

Filed:

Jan. 23, 1992
Applicant:
Inventor:

Kazuyuki Kanai, Kasai, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
738655 ; 364555 ;
Abstract

A method of using a technique of fuzzy inference for partioning a particle size distribution diagram indicative of a relationship between particle size and its frequency of a mixture of several kinds of granular substances, such as white blood corpuscles including lymph corpuscles, monocytes and granulocytes, to define particle size regions for the respective substances. More particularly, some estimation points are selected on the abscissa of the particle size distribution diagram and some characteristic parameters are calculated at each estimation point with the corresponding frequency. A fuzzy production rule for each characteristic parameter is applied to seek an estimated value of the estimation point and the estimated values for all characteristic parameters at each estimation point are combined to obtain a composite estimated value. The estimation point corresponding to the greatest one of all resultant composite estimated values is appointed to an objective partition point.


Find Patent Forward Citations

Kanai, Kazuyuki. (1994). Method of partitioning particle size distrubution datum (U.S. Patent No. 5359906). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5359906

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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