The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 1994
Filed:
Jun. 30, 1992
Roger Hayes, San Francisco, CA (US);
Luigi A Pio-di-Savoia, Mountain View, CA (US);
Sun Microsystems, Inc., Mountain View, CA (US);
Abstract
A test driver generator is provided for generating test drivers from test function designations and attribute value specifications of software interfaces. For each set of designations and specifications for a software interface, the test driver generator generates a test driver. The test driver executes the designated test functions selectively based on selections provided at its invocation, using the selected combinations of attribute values specified. For each selected combination of attribute values of each selected test function, the test driver creates the test data for the particular combination of attribute values, executes the selected test function and deletes the created test data. The test driver repeats the process for all selected combinations of attribute values of all selected test functions. For some embodiments, the test driver generator also generates attribute instance creation functions for providing the test driver with an assignable attribute value for each attribute of a selected test function's parameters. Additionally, the test driver either creates or deletes the test data in line or calls a user provided test data creation and deletion function to create and delete the test data. Furthermore, the test function may be auto-checking. In that event, the test driver also accumulates test statistics after each test function execution.