The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 1994

Filed:

Dec. 06, 1993
Applicant:
Inventors:

William Schroeder, Wayland, MA (US);

William K Kendrick, Jamaica Plain, MA (US);

Bruce Nappi, Reading, MA (US);

Assignee:

Foster-Miller, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441328 ; 36447405 ;
Abstract

A data processing system and method obtains a three dimensional representation of an object with complex and unique geometry, using a sampling probe having a tip for tracing the surface of the object. Electrical signals are received which are indicative of the position of the tip of the probe. An origin is determined with reference to the object. A plurality of distances, each distance corresponding to a given direction from the origin, is stored in a device addressable by the given direction to store and to retrieve a corresponding distance. The direction and distance of the probe tip with reference to the origin in response to a received signal. The determined distance is compared to any stored distance corresponding to the determined direction. The determined distance is stored when it is less than any stored distance. The probe tip position may be displayed as a projection on a reference surface which surrounds the origin.


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