The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 1994
Filed:
Jun. 08, 1992
Michael J Marchywka, Lanham, MD (US);
Dennis G Socker, Bowie, MD (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An apparatus and method for optically testing an object, such as an optical etector whose pixels are an array of optically sensitive charged coupled devices. Two mutually coherent beams of light are interfered on the object to form an interference fringe pattern of sinusoidally varying intensity of preselected spatial frequency. The object's response at this spatial frequency is used to determine one point of the object's modulation transfer function at that frequency. This is preferably done by using the device's output to infer the coherence function of the fringe pattern, taking the Fourier transform of the coherence function, and determining the amplitude of the function at the spatial frequency of the fringe pattern. The process can be repeated for different spatial frequencies until one determines the entire modulation transfer function.