The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 1994

Filed:

Sep. 28, 1992
Applicant:
Inventors:

Alan J Lowne, victor, NY (US);

James R Sandifer, Rochester, NY (US);

David S Uerz, Ontario, NY (US);

Steven C Switalski, Rochester, NY (US);

Hsue-Yang Liu, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01J / ;
U.S. Cl.
CPC ...
356418 ; 356419 ; 356 51 ; 250351 ;
Abstract

A spectrophotometer is described, comprising a single light source, a single detector, optics for dually and alternatively reading a sample and a reference, and only one moving part. That moving part is a chopper containing multiple pass-through apertures, each filled with a unique bandpass filter to select wavelengths to specifically illuminate the sample or reference. To inform the spectrophotometer whether and when it is reading the sample or the reference, trigger means are provided in at least twice the number of the pass-through apertures.


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