The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 1994

Filed:

Dec. 18, 1992
Applicant:
Inventors:

Yoichi Ishiguro, Yokohama, JP;

Haruhiko Aikawa, Yokohama, JP;

Minoru Watanabe, Yokohama, JP;

Yoshiaki Ichige, Naka, JP;

Fumitoshi Okamoto, Naka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356 731 ; 25022723 ;
Abstract

A spectroanalyzer accurately spectroanalyzes in spite of the deterioration of transmissibility of an optical fiber (5) by radiation, by using a light from a sample cell (1) as a measurement light which passes through the optical fiber (5). The spectroanalyzer comprises a white light source (15) for directing a monitoring light to a one end (5b) of the optical fiber (5), and a half-mirror (3) arranged in front of the other end (5a) of the optical fiber (5) for reflecting the monitoring light, which is modulated to permit the discrimination thereof from the measurement light. Accordingly, a degree of deterioration of the optical fiber (5) can be determined from the monitoring light, and the affect of the deterioration of the transmissibility can be corrected by dividing a measurement light power by a monitoring light power so that the accurate measurement of the sample cell 1 is attained in spite of the deterioration of the transmissibility of the optical fiber (5).


Find Patent Forward Citations

Loading…