The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 1994
Filed:
Dec. 26, 1991
Applicant:
Inventors:
Hiroaki Tanaka, Yokohama, JP;
Masaru Koyanagi, Tokyo, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G11C / ;
U.S. Cl.
CPC ...
3241581 ; 365201 ; 371 211 ;
Abstract
An semiconductor device includes an integrated circuit having first and second circuit sections formed on a semiconductor chip, at least one voltage stress testing pad formed on the semiconductor chip for supplying a voltage stress testing voltage or signal to the first circuit section, and a control circuit formed on the semiconductor chip for controlling and setting the second circuit section into a state corresponding to a voltage stress testing mode by using an input from the voltage stress testing pads.