The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 1994

Filed:

Sep. 09, 1992
Applicant:
Inventors:

Hideki Kambara, Hachiouji, JP;

Kazunori Okano, Shiki, JP;

Satoshi Takahashi, Kokubunji, JP;

Keiichi Nagai, Higashiyamato, JP;

Tetsuo Nishikawa, Itabashi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435-6 ; 2041828 ; 935 77 ; 935 78 ; 436 94 ;
Abstract

DNA molecule length can be measured with high precision and efficiency by 1) using such means as electrophoresis gel migration to orient a DNA molecule having a fluorescence label at both its termini into a straight line by its passing through a migration path having in a portion of it an area not more than several micrometers in diameter, detecting the fluorescence label at both the termini at a predetermined location and measuring the interval between the detection of the fluorescence coming from one terminus and that of the fluorescence from the other or by 2) a DNA molecule bound to a fluorescence label at one terminus and to a particle at the other being led as a whole by such means as electric field application into an aperture smaller in diameter than the particle, leaving the particle fixed at the mouth of the aperture to stretch the DNA molecule and detecting the fluorescence position to measure the distance between the bound particle and the bound fluorescence label.


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