The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 1994

Filed:

Jun. 03, 1993
Applicant:
Inventors:

David L Goodale, Yorba Linda, CA (US);

Steven D Mack, Mira Lona, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
2042 / ; 2041801 ; 436 43 ;
Abstract

A sample handling system suitable for use with a sample segment and a plurality of capillaries, including a rotatable and vertically translatable arm including an attachment portion to removably receive and retain the sample segment and a manifold adapted to removably retain the sample segment and the plurality of capillaries. The sample segment may be held by the attachment portion by the application of vacuum. Rotatable and vertical translation of the arm may be accomplished by a spindle and guide rails that are resiliently retained. The manifold may include a degassing reservoir and fluid manipulating valves retained by adapters configured to fail if external force is applied to the associated valve.


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