The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 1994
Filed:
Aug. 21, 1992
Hiroshi Kobayashi, Hanakoganei, Kodaira-Shi, JP;
Haruhiko Machida, Nakaochiai, Shinjuku-Ku, Tokyo, JP;
Jun Akedo, Tokyo, JP;
Tomoyuki Yamaguchi, Chiba, JP;
Hiroyoshi Funato, Chigasaki, JP;
Ricoh Company, Ltd., Tokyo, JP;
Other;
Abstract
An optical movement measuring method and apparatus measures a movement of an object. A light from a light source is irradiated on a diffraction grating which is provided on the object so as to generate diffracted lights of different order of diffraction. The diffraction grating has light transmitting portions and light blocking portions which are alternately and periodically arranged. Interference fringes which comprises bright and dark stripes which occur alternately and are generated by overlapping spots of diffracted lights of different order of diffraction are detected, and a movement of the object is measured based on a counted number of stripes of the detected interference fringes.