The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 1994
Filed:
Nov. 16, 1992
Gideon Dotan, Givat Avia 56 275 Yahud, IL;
Other;
Abstract
An inspection system for detecting surface flaws in a transparent element which includes a source of electromagnetic radiation, such as a laser beam or visible light, with the radiation beam directed edgewise into the transparent element to be inspected at such an angle that the resulting internal angle is larger than the critical angle. This ensures that substantially all of the radiation will stay within the transparent element and exit through an opposing edge of the transparent element unless a surface flaw is encountered, in which case a portion of the radiation will exit the transparent element through the surface of the transparent element. The system includes a detector, such as a line or matrix charge coupled device, capable of detecting the portion of the radiation which exits the transparent element through the surface of the transparent element and of producing signals corresponding to the exiting radiation.